MIL-STD-750: Test Methods Standard for Semiconductor Devices
MIL-STD-750,It is a standard approved by all units and agencies of the Department of Defense.
This standard establishes a set of standard test methods for testing the environmental, physical and electrical properties of semiconductor devices. It is especially applicable to semiconductor devices suitable for use in military and aerospace electronic systems. The standard covers basic environmental, physical and electrical testing to determine the resistance of semiconductor devices to harmful effects under natural elements and conditions specific to military and space operations. The term “devices” includes items such as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related parts.
The test methods and procedures of this standard have been prepared to serve several purposes:
- Determination of Test Conditions: To obtain test results equivalent to actual service conditions in the field and to ensure repeatability of test results by determining the conditions that can be obtained in the laboratory environment. The test methods described in this standard should not be interpreted as a complete and accurate representation of actual service operation in any geographic location. Because it is known that a true test for operation at a particular location is only the service test performed at that point.
- Standardization of Test Methods: In this set of standards, by defining all test methods of similar character included in the semiconductor device specifications of various services, ensuring that these test methods are compatible with each other and thus protecting equipment, workforce and test facilities. To achieve this goal, it is necessary to make each general test method adaptable to a wide range of devices.
- Applicability to Other Parts: The environmental, physical and electrical test methods described in this standard should also be applied when applicable to parts not covered by an approved military form standard, specification sheet or drawing.
MIL-STD-750, It provides standardization of test methods to ensure the reliability and performance of semiconductor devices in military and aerospace applications.